“Information is not a knowledge”

- Albert Einstein -

Journal Publications

Stanczyk, S., Kafar, A., Grzanka, S., Mroczyński, R., Suski, T., Perlin, P., 450 nm (Al,In)GaN optical amplifier with double 'j-shape' waveguide for master oscillator power amplifier systems, Optics Express 26 (6), (2018).

Mazurak, A., Jasiński, J., Mroczyński, R., Stress-and-Sense Investigation of Memory Effect in Si-NCs MIS Structures, Physica Status Solidi (B) Basic Research (2018), 1700634,

Mroczyński, R., Jasiński, J., Electro-Physical Properties of Gate-Last Silicon MOSFETs with Low-Temperature SiOxNy/HfOx Stack After Ultra-Shallow Fluorine Implantation from RF Plasma, Physica Status Solidi – Rapid Research Letters (2018), 1800152,

Mroczyński, R., Kwietniewski, N., Konarski, P., Effects of ultra-shallow ion implantation from RF plasma onto electrical properties of 4H-SiC MIS structures with SiOx/HfOx and SiOxNy/HfOx double-gate dielectric stacks, Microelectronic Engineering (2017), 178, pp. 116-121​.

R. Mroczyński, A. Mazurak, Feasibility study of the application of co-doped all-inorganic silicon nanocrystals (Si-NCs) in Thin-Film Transistor (TFT) structures, EMRS Fall Meeting, September 17-20th 2018 Warsaw.

M. Puźniak, W. Gajewski, R. Mroczyński, Effect of magnetron sputtering deposition parameters onto electrical and optical properties of HfOxNy thin films, EMRS Fall Meeting, September 17-20th 2018 Warsaw.

M. Kieliszczyk, B. Janaszek, A. Tyszka-Zawadzka, R. Mroczyński, P. Szczepański, Tunable Hyperbolic Metamaterials for Novel Photonic Devices, Pacific Rim Conference on Lasers and Electro-Optics (CLEO), July 29th – August 3th, 2018 Hong Kong.

A. Mazurak, R. Mroczyński, Investigation of Memory Effect with Voltage or Current Charging Pulse Bias in MIS Structures based on codoped Si-NCs, EUROSOI-ULIS Conference, March 19–21th, 2018, Granada (Spain).