•  Seweryn A., Lawniczak-Jablonska K., Kuzmiuk P., Gieraltowska S., Godlewski M., Mroczyński R., Investigations of Structural and Electrical Properties of ALD Films Formed with the Ozone Precursor, (2021) Materials 14(18):5395; DOI: 10.3390/ma14185395.

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• Zdanowicz M., Mroczyński R., Szczepański P., Strong second-harmonic response from semiconductor–dielectric interfaces, (2021) Applied Optics 60, 1132-1136; DOI: 10.1364/AO.414255.

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• Schiavon D., Mroczyński R., Kafar A., Kamler G., Levchenko I., Najda S., Perlin, P., Refractive Index of Heavily Germanium-Doped Gallium Nitride Measured by Spectral Reflectometry and Ellipsometry, (2021) Materials 14, 7364; DOI: 10.3390/ma14237364.

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• Mroczyński R., Iwanicki D., Fetliński B., Ożga M., Świniarski M., Gertych A., Zdrojek M., Godlewski M., Optimization of Ultra-Thin Pulsed DC Magnetron Sputtered Aluminum Films for the Technology of Hyperbolic Metamaterials, (2020) Crystals 10, 384; DOI: 10.3390/cryst10050384.

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• Mazurak A., Mroczyński R., Beke D., Gali A., Silicon-Carbide (SiC) Nanocrystal Technology and Characterization and Its Applications in Memory Structures, (2020) Nanomaterials 10(12):2387; DOI:10.3390/nano10122387.